在壽命檢測試驗中，當我們因故或基於實驗上的方便無法連續觀察檢驗產品時，可以採用區間設限方式進行試驗，此外，對於許多長壽命的零件與產品，我們很難在試驗結束之前觀測到足夠的試驗單位死亡個數，此時可以採用加速壽命試驗的方式進行試驗，此種試驗方法可使受測的試驗單位提早故障，以有效地減少試驗所需的時間，並達到縮減成本的目的。本論文結合逐步應力加速試驗、型一設限以及區間設限，探討當產品壽命服從Rayleigh分配時，如何建立壽命檢驗計畫，在給定生產者風險與消費者風險下，求出壽命檢驗計畫所需的最小樣本數，以及判定貨批是否接受的壽命檢定臨界值，並將以上結果編製成表，以利實務界使用。

In life test experiment we use interval censoring to complete it when we can not inspect the experiment units continuously due to some accidents or for convenience. Furthermore, it is difficult to obtain enough units of breakdown products for many long life components and products. At this moment we can adopt step-stress life test to proceed the experiment. Using this method we can make the test units breakdown early for reducing the time test needed effectively and save prime cost. In this thesis, acceptance sampling plans are established for Rayleigh lifetime data under step-stress and type I interval censoring scheme. The minimum sample sizes and the corresponding critical values of lifetime needed for test plans are found. Some tables are provided for the use of the proposed test plans.

Mann et al. (1974). Methods for Statistical Analysis of Reliability and Life Data, New York: Wiley.
Miller, R. and Nelson, W. (1983). Optimum Simple Step-Stress Plans for Accelerated Life Testing, IEEE Transactions on Reliability, 32, 59-65.
Nelson, W. (1990). Accelerated Testing: Statistical Models, Test Plans, and Data Analysis, New York: Wiley.
Meeker, W. Q. and Escobar, L. A. (1993). A Review of Recent Research and Curren Issues in Accelerated Testing, International Statistical Review, 61, 147-168.
Xiong, C. (1998). Inferences on A Simple Step-Stress Model with Type-II Censored Exponential Data, IEEE Transactions on Reliability, 47, 142-146.
Tseng, S. T. and Wen, Z. C. (2000). Step-Stress Accelerated Degradation Analysis for Highly Reliable Products, Journal of Quality Technology, 32, 209-216.
Lawless, J. F. (1982). Statistical Models and Methods for Lifetime Data, John Wiley & Sons, New York, NY.
Cheng, K. F. and Chen, C. H. (1988). Estimation of the Weibull Parameters with Grouped Data, Communications in Statistics -Theory Methods, 17, 325-341.
Lui, K. J., Steffey, D. and Pugh, J. K. (1993). Sample Size Determination for Grouped Exponential Obervations: A Cost Function Approach, Biometrical Journal, 35, 677-688.
Chen, Z. and Mi, J. (1996). Confidence Interval for the Mean of the Exponential Distribution, based on Grouped Data, IEEE Trans -actions on Reliability, 45, 671-677.
Meeker, W. Q. and Escobar, L. A. (1998). Statistical Methods for Reliability Data, New York: Wiley.
Aggarwala, R. (2001). Progressive Interval Censoring: Some Mathem- atical Results with Applications Inference, Communications in Statistics-Theory Methods, 30, 1921-1935.
Epstein, B. (1954). Truncated Life Tests in the Exponential Case, Annals of Mathematical Statistics, 25, pp. 555-564.
Spurrier, J. D. and Wei, L. J. (1980). A Test of the Parameter of the Exponential Distribution in the Type I Censoring Case, Journal of American Statistical Association, 75, pp. 405-409.
Grant, E. L. and Leavenworth, R. S. (1996). Statistical Quality Control, McGraw-Hill, New York, NY.
Kim, S. H. and Yum, B. J. (2000). Comparisons of Exponential Life Test Plans With Intermittent Inspections, Journal of Quality Technology, 32, 217-230.
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